204Heo8756 Nullification of Registration (specific)

Pakistan Co., Ltd.

The additional Dong 60 - 29

The representative director Lee Jae-chul

1. Law Firm continental shelf

Attorney Cho Jong-chul, Kim Jin, Kim Jong-dong, and Kim Il-young

2. Attorney-at-law in the order of business ethics, name of attorney, maximum punishment, and maximum contribution;

Patent Attorney Kim Chang-chul, Jeon Chang-chul, Park Chang-chul, Shin Dong-dong, Song Jin-jin

Barp Factors, Fork (for example, de-factor. c.)

United States of California 94550 Libera dr. dr. 2140

Representative Scade L. Mercadeo

Attorney Choi Young-young, Yang Young-young, Korea's day, White, Cho Jong-kak, Park Yong-kak, Counsel for the defendant-appellant

Patent Attorney Cho Jae-ho, Sung-dong, Ansan-ho, Park Jong-ho, Kim Sung-ho, leap

Patent attorneys' dives, Nowon-guing

September 15, 2005

October 27, 2005

1. Of the trial decision rendered by the Intellectual Property Tribunal on November 30, 2004 regarding the case No. 585 on November 30, 2004, the part regarding claims No. 1, 3, 4, 13, 16, 27, 28 and 32 of the Patent Act shall be revoked.

2. The costs of lawsuit shall be borne by the defendant.

The order is as set forth in the text.

1. Details of the instant trial decision

A. The defendant is the right holder of the invention of this case as follows.

(1) Title: The method of changing the course of exploration in an assembly of search cards.

(2) Date of registration / Number of registration: October 18, 200, No. 278342

(3) Application number: PC/US 94/1373/137, November 16, 1994; PC/US 1995/1484/13, November 13, 1995; PC/US 1984/144, November 13, 1995)

(4) Claims: Attached Form 1.

B. On March 19, 2004, the Plaintiff filed a petition for a trial on invalidation of a patent with respect to "the method to change the course of search elements in assembly of the search card", claiming that the registration should be invalidated without any possibility of industrial applicability, detailed description and claims, and that the registration should be invalidated in light of the comparable inventions. The Intellectual Property Tribunal deliberated on the instant invention as 2004No.585, Nov. 30, 2004, and decided on Nov. 30, 2004, the subject of the instant invention constitutes an industrial-use invention under the main text of Article 29(1) of the Patent Act. The detailed description and claims of the instant invention cannot be deemed to lack the provisions of Article 42(3) and (4) of the Patent Act, and the claims of the instant invention cannot be deemed to be satisfied, and the scope of claims of the instant invention cannot be easily accepted by the Plaintiff on the grounds that it is not identical to the invention 1 through 9 (Invention 7 and the cited inventions 1 through 35).

【Evidence A’s Evidence Nos. 1, 2, 3-1 and 2-2, the purport of the whole pleadings

2. Summary of the grounds for revocation of the Plaintiff’s trial decision

The claim Nos. 1, 3, 4, 13, 16, 27, 28, and 32 (hereinafter referred to as the "claim Nos. 1, 3, 4, 13, 16, 27, 28, and 32 (hereinafter referred to as the "claim Nos. 1, 3, 4, 16, 27, 28, and 32") of the invention of this case are merely capable of easily inventive from comparable inventions, and their registration shall be invalidated. The part of the decision of this case on trial is unlawful.

3. Determination

A. Summary of the instant invention

In full view of the purport of the argument in Gap evidence 1, each invention of this case concerns the method by which each semiconductor device (Death) changes the bend of the searched element (e.g., e., e., tamping direction) to inspect the inferiorness of semiconductor devices generated from the manufacturing process before individualization. The existing searched card assembly includes the number of tamples extended from the surface of the search card to tamper as tamper, and the number of tamples ordinarily installed in the search card to tamper ordinarily are extended from the outer part of the search card to the outside part of the semiconductor, and thus, it is inconsistent with the objective of semiconductors to search the new location of each semiconductor device, and if it is difficult for each semiconductor to search such other, it is difficult for each of such other to search the new location of semiconductor devices, and it is also difficult for each of such other to search the new location of semiconductor devices to solve the problems of semiconductors.

B. Criteria for determining the originality and inventive step of an invention

In principle, the scope or scope of a patent right subject to determination as to whether an invention has a newness or inventive step shall be determined based on the claims described in the specification attached to a patent application. However, in a case where the technical composition of the patent is unknown or it is impossible to determine the technical scope even if the description is known, the supplement may be made by means of other descriptions in the specification. In such a case, the extended interpretation of the scope of a patent is not allowed by other descriptions in the specification, and in a case where the technical scope is apparent only by the description in the specification, the limitation of the claims cannot be interpreted by other descriptions in the specification (see Supreme Court Decision 19

5. 28. See Supreme Court Decision 96Hu1118 delivered on April 28, 200

C. Whether the instant Claim 13 invention is recognized as non-obviousness compared to the comparable inventions (1) technology, and preparation for the purpose of the technical field and purpose

The purpose of the instant Claim 13 is to conduct accurate search and inspection by providing a base of support for semiconductor chips to be searched between the instant search and chips using the same type of semiconductor chips. The purpose of the instant Claim 1 is to promote reliable connection between the search and semiconductor chips corresponding to the semiconductor chips by using the same type of semiconductor chips and to facilitate the search and seizure of semiconductor chips. The purpose of the instant Claim 1 is to provide multiple search and seizures of semiconductor chips for the purpose of semiconductor 200,000,000,000,000,000,000,000,000,000,000,000,000,000,000,000,000,000,00,000,000,000,00,000,00,000,00,00,00).

In this regard, the defendant classify the previous search cards as a member blick, twelve, and swelve swelven swelve, according to its technical composition, while the search swelves launched in comparable invention 1 through 3 all previous search swelves or similar search swelves. On the other hand, paragraph 13 inventions of this case are completely new structure "members (Ems, Mirir Emcir Emc swelves) swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves swelves s welves s welves.

The instant Claim 13 invention can be understood as a stage of providing search cards (hereinafter referred to as "class 1") and (b) providing support floors with multiple search elements to search and inspect semiconductor devices (hereinafter referred to as "class 2") and (c) attaching support floors on search cards (hereinafter referred to as "class 3") and (d) changing the direction toward support floors to search and inspect semiconductor devices in the assembly of search cards (hereinafter referred to as "class 4").

A) The elements of the instant Claim 13 invention are “the stage of providing a search card by changing the direction of the search elements in order to practically search for semiconductors in the unit of the search card,” which is “the stage of providing a search card,” which is “the stage of providing PCB plates,” which is the stage of semiconductor search devices of comparable invention 2: (a) the stage of providing a hub card (1) in the unit of semiconductor search devices of comparable invention 3; (b) the stage of providing a card board (2) the unit of the prior art 4’s prior art 4’s prior art 2; (c) the unit of the prior art 1’s prior art 3’s prior art 1’s prior art 4’s prior art 2’s prior art 5’s prior art 13’s prior art 5’s prior art 5’s prior art 5’s prior art 13’s prior art 2.

B) The elements of the instant Claim 13 are 0 stages of providing support for multiple semiconductors 1 to search for semiconductors 4 on the surface of 0 (the number of semiconductors 1) and 5 (the number of semiconductors 1 to search for semiconductors 4) used to identify semiconductors 5 (the number of semiconductors 1 to search for semiconductors 4) used to identify semiconductors 5 (the number of semiconductors 1 to search for semiconductors 5) used to connect each (the number of semiconductors 2 to search for semiconductors 5) used to identify semiconductors 1 to 5 (the number of semiconductors 1 to search for semiconductors 4) used to connect each (the number of semiconductors 1 to 5) used to identify semiconductors 1 to 4) used to provide a non-disscept (the number of semiconductors 4 to search for semiconductors 1 to 5). The number of semiconductors 1 to be used to expand 1 to 15 (the number of semiconductors 1 to 20).

However, the support response of the Claim 13 invention of this case (506) has a cover-to-face screening, while the composition corresponding to the cited inventions 1 through 3 is different in that it has a pande, a sudden gap, or a probiling. Accordingly, the specification of the invention of this case is desirable to easily create the connection structure with the structure of the 's cover-to-face screening (free - interconnection)' from the different height of the base floor to the common height of the base floor, such as the PCB, etc. In addition, the electrical and mechanical characteristics of the mutually connected elements under this invention (for example, small nature and carbon characteristics) are easily obtained from special usage. In addition, it is desirable to bring a lawsuit to ensure the reliability and reliability of the connection element if it is necessary for the mutual connection element.

The terms used in this context are applied to the contact structure, and the term "(s)" refers to the shot structure (interconnection elements) mainly indicating the shot behavior by responding to the authorized sub-paragraph (explosive contact force)" (see Section 10, 11 of evidence A). The multiple search search elements of the invention of this case (mutual connection structure) are installed on the support layer, fixed, and the other part is the 3rd unit of the invention of this case so that each of the search elements of the above 13rd unit can be carried out by shotnings established by the extension of the length of the 3rd unit by forming the free base of the invention of this case by forming a certain length extension from the support layer to the 3rd unit so that each search elements of the invention of this case can be carried out by shotnings established by the pressure authorized by the free base, and it can be known that there is no clear difference in the length and sub-sections established by the free base of the invention of this case.

However, in the specification of the invention of this case, "generally, the assembly of previous technology search cards shall include multiple tft content extended from the surface of the search card to be fluortized from the surface of the search card (see Section 1, No. 2, No. 8)," and "the term "fluortt and canter base" shall be installed in a part of a longer structure (fixed). Other parts normally indicate that they can freely move by responding to the power that can act in the direction of crossing on the breeding stock of a longer element instead of the tension, and "(see Section 1, No. 8, No. 7, et al., No. 7)."

5) As the structure of the instant chip is composed of 10 lines or 10 parts of the line (12) so that each contact party is able to have good contacts (13) by putting off the line from the surface of the card board (12) so as to make it possible (see, e.g., No. 17 and No. 1-3 of the No. 7) to create a new e.g., 0 cell line (see, e., Supreme Court Decision 200Du1440, Apr. 10, 200) by 200.

In this regard, the Defendant asserts that the 1string of the instant Claim No. 13 on the 6th base of comparable invention No. 1 is a non-disused Invention No. 1’s transparent m. 1’s m. m. 2’s m. m. m. 2’s m. m. m. 1’s m. m. 1’s m. m. 2’s m. m. 1’s m. m. 2’s m. m. m. 1’s m. m. 2’s m. m. 1’s m. m. 1’s m. m. 2’s m. m. 1’s m. m. 1’s m. m. m. 2’s m. m. 2’s m. m. m. 1’s m. 2’s m.

(D) The 4 components of the instant Claim 13 are as follows: (a) in the stage of de facto change of the route of the 3rd of the date of semiconductor 1 by means of reference to the 5-lane chips; and (b) in the stage of controlling the reputation of semiconductor 1 from comparable Invention 2 to the date of reference to the 5-lane chips that are marked on the 6-lane chips by means of reference to the 3-lane chips; and (c) in the stage of controlling the 5-lane chips of semiconductor 1 by means of reference to the 5-lane chips that are marked on the 5-lane chips; and (d) coordinating the 5-lane chips of semiconductor 1 by means of reference to the 5-lane chips that are marked on the 5-lane chips; (e.g., coordinating the 506-meters of semiconductor chips to the end of the 5-meter chips.

이에 대하여 피고는, 비교대상발명 1의 미세 조절나사는 멤브레인의 배향을 변경하는 구성이 아니라 탐침카드를 구성하는 PCB 기판, 평면조절판 등의 부품들을 상호 ‘ 체결 ' 하는 기능을 수행하는 것이고, 비교대상발명 1에 기재된 “ coarse vertical adjustment " 라는 용어가 기재되어 있으나 이는 멤브레인 카드의 기술적, 구조적 한계를 고려할 때 전체적 평면성 ( gross / global planrization ) 과 관련된 것이라기보다는 국부적 평면성 ( local planarization ) 에 관련된 것으로 보아야 하므로, 이 사건 발명에서 ' 전체적인 평면성 ' 을 달성하는 기능을 수행하는 배향조정수단과는 차이가 있다고 주장하므로 살피건대, 비교대상발명 1에 “ 미세조절나사를 갖는 평면판은 탄성고무판을 통해 멤브레인을 지지해주며 반도체와의 사이에 균등한 압력을 주도록 되어 있다. 1 ~ 2mil 이내의 거친 평면성 조절에 사용한다 " ( 갑 제4호증의 제22쪽 제13 ~ 18줄 참조 ), “ 박막 웨이퍼 탐침검사 시스템의 모듈 조립체는 평탄화 조정 및 X - Y 배향조정을 용이하게 한다. 평탄도에 있어서의 미세한 변동을 흡수하는 광학적 투명 탄성체에 의해 시료 ( DUT ) 에 대한 박막 테스트 카드의 배향 조정이 용이하게 된다. 평탄화 나사에 의해 거친 수직 방향의 조정 ( coarse vertical adjustement ) 이 행해진다 ” ( 갑 제4호증의 제21쪽 그림 6. 의 하단 설명 부분 참조 ) 라고 기재되어 있고, 그 그림 6. 과 그림 31. 에 미세 조절나사가 평면판 , PCB 기판 및 멤브레인이 접착된 베크라이트 ( bakelite ) 에 체결되어 있는 멤브레인 카드 조립체의 구성이 도시되어 있는바, 비록 미세 조절나사의 동작원리 등에 관하여 구체적으로 기재되어 있지는 않으나, 이 사건 발명이 속하는 기술분야에서 통상의 지식을 가진 자라면, 위 기재 및 도시 내용으로부터, 비교대상발명 1의 미세 조절나사는 멤브 레인 카드 조립체의 조립시 부품들을 체결하는 기능을 수행하는 동시에, 그 기술용어 “ 미세 조절 나사 ” 또는 “ 평탄화 나사 ” 가 의미하는 바대로, 평면판에 구비된 미세 조절나사 즉, 평탄화 나사를 좌우로 회전시킴으로써, 멤브레인의 수직 방향의 배향을 미세하게 조절하여 반도체 웨이퍼 또는 PCB 기판에 대한 멤브레인의 평면성을 조절하는 기능도 수행하는 것이라는 점, 또한 국부적 평면성이라는 것은 탄성을 가진 개개의 탐침요소가 반도체 다이 상의 대응되는 전극패드에 접촉할 때, 접촉압력에 의한 탄성 변형이 이루어져 반도체 다이 패드들 또는 탐침요소 팁들의 개별적인 높이 차이를 국부적으로 보상하는 개념인데, 비교대상발명 1의 멤브레인에 부착된 범프는 비탄성의 탐침요소이기 때문에 국부적 평면성을 달성할 수 없는 것은 자명한 사항이라는 점, 더 나아가 갑 제9호증에 “ 원형 헤드에 결합된 4개의 조절나사 ( S1 ~ S4 ) 를 회전시킴으로써 , IC 장치의 모든 접촉패드 ( 17 ) 와 프로브 조립체의 멤브레인 ( 13 ) 의 접촉영역의 면이 정확히 평행한 면을 이루도록 하여 원하는 평행성을 달성하는 기술 ” ( 갑 제9호증의 칼럼 9 “ 평탄화 ( Planarization ) " 부분 요약, 도면 제3도 참조 ) 이 개시되어 있어, 멤브레인 타입의 프로브 조립체에서도 조절나사에 의하여 전체적 평면성을 달성할 수 있는 것임을 알 수 있는 점에 비추어, 비교대상발명 1에서 미세 조절나사 또는 평탄화 나사의 조절에 의하여 멤브레인의 배향을 조정하는 것은 탐침기능을 수행하는 범프가 부착된 멤브 레인의 전체적 평면성을 달성하기 위한 것이고, 이에 따라서 “ coarse vertical adjustment " 라는 용어도 전체적 평면성과 관련된 것으로 보아야 하므로, 피고의 위 주장은 이유 없다 .

(3) Preparation for effects of action

The Claim 13 invention of this case constitutes a support floor with a search tample 1 through 4, and, in the event that an search tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper tamper 1 through tamper 2.

As to this, the defendant asserts that the search card assembly based on the invention of this case does not include the composition directly related to the above effect claimed by the defendant, and if it can achieve the same effect only with the composition described in paragraph (13) invention of this case, it can achieve the same effect as that of the defendant's assertion, it is clear that the combination of comparable inventions that can be used in the composition of Claim 13 invention of this case can achieve the same effect as that of the defendant's assertion, since the defendant's assertion is without merit, the combination of comparable inventions that can be used in the composition of Claim 13 invention of this case can achieve the same effect as the defendant's assertion.

(4) The summary of the comparison results is the same as the technical field of the cited invention 1 through 4. Among the two inventions, the purpose of the comparison is substantially the same as the technical field of the cited invention 1 through 3. In the composition, the elements of the Claim 13 invention of this case can be combined with the composition that is substantially identical or widely known and known to the composition that is commenced in the comparable invention 1 through 4, and the elements 4 are the same as those corresponding to the comparable invention 1 and 3. Thus, the Claim 13 invention of this case can easily be made by a person with ordinary knowledge in the technical field to which the invention of this case belongs by combining the comparable invention 1, 3 or the comparable invention 1, 3 or the comparable invention 2, and 4.

In order to determine the inventive step of a patent invention by citing various prior art documents, the Defendant presented the motive that the patent invention can be patented if combined with the prior art documents. The cited inventions in the instant case asserted that the combinations with the inventions in the instant case cannot deny the inventive step of the invention by the combination of comparable inventions since the combinations with the inventions in the instant case are not entirely suggested or inappropriate. However, both the inventions and the comparable inventions in the instant case are related to the assembling of prob cards or search cards, and in order to inspect semiconductor devices, all of the contact points of semiconductor devices are practically the same size, so it is essential for all of the contact points of semiconductors to make the contact points of semiconductors in the technical field equal to those of semiconductors, and it is not necessary for the combinations of semiconductor devices and prob cards to accomplish the purpose of the prior inventions in the instant case, and thus, it is not necessary for the combinations with the prior art to achieve the purpose of the prior inventions in the instant case, and it is not necessary for the combinations with the prior art to achieve such objective and the purpose of the prior inventions.

In addition, the defendant asserts that the invention of this case was made available for the first time as a member (Mams and Micro Emsctic Emsplate) assembly, and that the product implemented has commercial success, and thus its inventive step should be recognized. However, the commercial success of the product implemented by the invention is used as a supplementary material for the determination of inventive step, and it cannot be determined by itself as to the inventive step of the invention. As seen earlier, as long as the invention of this case is found to have no inventive step compared to the cited inventions in its purpose, composition, and operating effect, the conclusion may not vary depending on commercial success. Thus, the above argument is without merit.

D. Whether the instant Claim No. 16 invention is recognized as non-obviousness compared to the comparable inventions, and the instant Claim No. 16 invention is an invention described in a subordinate claim citing Claim No. 13, which is a dependent claim No. 13 of the instant Claim No. 13, and “the support base floor in the instant Claim No. 13 invention is a Spanish franchise.” Thus, it should be examined mainly with the modified elements.

Therefore, the term "Spanishing machine providing multiple semiconductor search elements to search and inspect semiconductor devices of the instant Claim 16" is the stage of providing members of the group with multiple (brump) for the inspection of semiconductors of comparable invention 1's "Spanishing semiconductors", the stage of providing "Spanishing unit (14) of comparable invention 2's "Spanishing unit (2) to inspect semiconductors," the stage of providing "Spanishing unit (16) with the same type of inspection board (2) for the inspection of semiconductors of comparable invention 3's semiconductor chips, the stage of providing a transparent board (3) for the inspection of semiconductors of semiconductors 4's semiconductors, or the stage of providing 105's "Spanishing unit (16) or 16's "Spanishing unit (6) for the inspection of semiconductors 4's semiconductor integrated circuits," and the stage of providing 105's "Spanishing unit (16) and 16's prior function.

(2) According to the comparison Invention 1, 6, 2, 6, 2, 4, 2, 2, 2, 2, 2, 2, 2, 2, 3, 2, 2, 2, 3, 4, 2, 2, 2, 4, 2, 2, 2, 2, 2, 2, 3, 4, 5, 2, 2, 5, 2, 3, 4, 5, 5, 6, 5, 6, 5, 6, 5, 6, 6, 5, 6, 6, 6, 5, 6, 6, 6, 6, 6, 6, 1, 6, 5, 6, 6, 6, 6, 6, 1, 6, 6, 5, 6, 1, 6, 5, 5, 6, 5, 6, 1, 5, 6, 6, 6, 1, 6,

Therefore, the instant Claim 16 invention could easily be made by a person with ordinary knowledge in the technical field to which the instant invention pertains from the combinations between the comparable invention 1, 3, and comparable invention 2, 4.

E. The claim 1 invention of this case, whether non-obviousness is recognized compared with the cited inventions, is comprised of the following: "In the process of changing the course of the search elements in the assembly of search cards," the stage of providing search cards, the stage of providing support floors for the search and inspection of semiconductor devices, the stage of installing support floors on the search confirmation cards, and the stage of changing the direction of support floors on the search confirmation cards." In comparison with the claim 13 invention of this case, the composition of the claim 13 invention of this case is required.

In the case of paragraph (1) invention of this case, 'B' in the stage of providing support layers with multiple search elements to search and inspect semiconductor devices, which are 2 elements in the lawsuit, is composed of 'the stage of providing support storys with multiple search elements to search and inspect semiconductor devices', and 'the scope of search intrusion elements' is expanded, and 'the invention is substantially the same as the invention of paragraph (13) invention of this case. Thus, for the same reason, a person with ordinary knowledge in the technical field to which the invention of this case belongs can easily cite from combinations 1 and 3 of comparable inventions 1, 3 or comparable inventions 1, 3 and 2, and 4 of comparable inventions 2 and 4.

F. Whether the instant Claim No. 3 invention is recognized as non-obviousness compared to the cited inventions. The instant Claim No. 3 invention is a subordinate claim citing Claim No. 1 of the instant Claim No. 1. The support impulse is characterized by “Span Spans franchises.” However, as it had already been examined in the foregoing D., the composition of the instant Claim No. 3 invention installed in the Spans that can detect electrical signals by having contacted the response failure of semiconductorwafers in the search card assembly and detecting electrical signals in the search card assembly is installed in the search card assembly. As such, the composition of the instant Claim No. 3 invention No. 2 of the cited invention No. 14 of the cited invention No. 14 of the examination board (14) which can be changed to inspect semiconductor elements, and the composition of the instant Claim No. 3 of the cited Invention No. 4 of the cited Invention No. 1 of the same technology as the art No. 2 of this case, and the modification of which falls under the instant Claim No. 31 of the cited Invention No. 4 of this case.

G. Whether the instant Claim No. 4 invention is recognized as non-obviousness compared to the cited inventions. The instant Claim No. 4 invention is an invention described in the subordinate claim citing Claim No. 1 of the instant Claim No. 1, and the search elements in the instant Claim No. 1 invention are characterized by the structure of carbon contact. However, according to the overall specification of the instant invention, the instant claim No. 4 invention is described as the structure having the concept substantially identical with the instant Claim No. 13 invention, which is substantially the same as the instant Claim No. 13 invention. As seen in Section 3, the instant claim No. 4 invention can be easily claimed by a person with ordinary knowledge in the technical field to which the instant invention pertains, from the combination of comparable inventions 1, 3, or comparable inventions 1, 3, and 2, and 4.

H. The Claim 27 invention of this case is, compared to the cited invention 3, the non-obviousness of the instant Claim 27 is recognized. Since the instant Claim 27 invention is composed of: “In the process of providing a search card; the stage of providing a support story to search semiconductor devices; the stage of installing a support story on the search card; and the stage of changing the direction of support stories on the search card; it is the stage of changing the search bed; it is an invention having the same meaning as that of the instant Claim 2, which is “a person having the characteristics of the instant Claim 3, changing the right to search for the search card,” which is “an invention having the same meaning as that of the instant Claim 1, which is referred to in the fourth element of the instant Claim 2, and thus, is an invention having the same meaning as that of the instant Claim 1, which is identical to that of the instant Claim 2, which is ordinarily identical to that of the instant Claim 3.

(j) Whether the instant Claim No. 32 invention is recognized as non-obviousness compared to the cited inventions. The instant Claim No. 32 invention is an invention described in the subordinate claim citing Claim No. 27, and the “the supporting body floor in the instant Claim No. 27 is a Spain franchise,” and according to the above A, the instant Claim No. 27 invention is deemed to be the same as the instant Claim No. 3 invention, and as such, as the instant Claim No. 32 invention has already been examined in the foregoing F., it is easy for a person with ordinary knowledge in the technical field to easily make an invention from the combination of Claim No. 1, 3, and Cited Invention No. 2 and 4.

j. Sub-committee

Therefore, the nonobviousness of the instant inventions as referred to in Articles 1, 3, 4, 13, 16, 27, 28, and 32 of the Patent Act is denied in light of comparable inventions. Thus, the registration shall be invalidated in accordance with Articles 29(2) and 133(1)1 of the Patent Act, and the part on each of the instant inventions in the trial decision is unlawful in conclusion.

4. Conclusion

Thus, the plaintiff's claim seeking the revocation of the part concerning the invention of this case Nos. 1, 3, 4, 13, 16, 27, 28, and 32 among the decision of this case is justified, and it is so decided as per Disposition.

Judge Park Dong-dae

Judges Doing-type

Judges Kim Young-young

Attached 1. The invention of this case

(a) Claims;

1. Training of elements of search for the search and inspection of semiconductor devices in assembly of search cards;

by changing the direction, the steps of providing the search card and the search and inspection of semiconductor devices.

at the stage of providing support for multiple search factors, and on the search card.

The step in which the stratos are installed and the step in which the stratosium is changed to the direction of support for the search card.

Method with the characteristic of including it.

3. In regard to claims 1, the support floor is characterized by Spanish franchises.

Method.

4. In regard to claims in paragraph 1, a room with characteristics that is a structure of carbon contact.

13. The distribution of elements of search for the search and inspection of semiconductor devices in assembly of search cards;

by changing the direction, the steps of providing search cards and the search and inspection of semiconductor devices.

level and level in which support is provided with more than one type of crowdfunding search factors;

The stages of attaching support stories on the search card and changes in the direction of support stories on the search card.

Method with a characteristic to include a level of light.

16. In Claim 16.13, support-based floors are characterized by Spanish franchises.

manner. The method shall be

27. Claims 27. The distribution of search elements for the search and inspection of semiconductor devices in assembly of search cards;

by changing the direction, the steps of providing the search card and the search and inspection of semiconductor devices.

at the stage of providing support for multiple search factors, and on the search card.

Search by changing the direction and direction of support for the tamper’s tamper’s tamper’s tamper’s tamper’s card

It is characterized by including steps to change the course of inquiry into the cards;

In claim 28. In paragraph 27, the elements of the search are set-up and carbon.

manner by which such method is applicable.

32. In Claim 32. In paragraph 27, support layers are characterized by Spanish franchises.

manner. The method shall be

(Other claims are omitted)

(b) Drawings (representative drawings);

Do5

- 500

Do 4

400

* The Roster (504) appearing in Do 5 is limited to tampers (502) and Tampers (544, 504).

For access to the invention of this case, description as a component of Claim No. 2 of the invention of this case

As such, it is not directly related to claims that are at issue in the lawsuit of this case.

Attached 2. Invention 2.

1. Invention 1;

A. Summary of the invention

A A The Korean Institute of Machinery and Technology prepared around March 1992 and submitted it to the Minister of Science and Technology

(i) an invention described in a final report on the development of Mmmed Manufacturing Technology:

The summary of the "member sobb card" is a flat board equipped with a fine control or yarn, PCB (printed circuit).

1) At the time of the search and inspection of wafers, members with coal rubber plates, and members with pans attached with pans, and the time of the search and inspection

Modr assembly of an item shall facilitate the adjustment and adjustment of flatization and X - Y exhausting coordination, and in flat chart;

A sample (DUT, Device UN) by a optical transparent carbon that absorbs an aesthetic change.

Test. Emp. H. H. H. A. H. H. H. T. H. H. T. H. T. H. T. H. T. H. T. H. H. T

a member, through a coal rubber board, support the members of the group, and make equal pressure between semiconductors.

It is known that it is used for the adjustment of equilibrium that has been replaced by not more than one to two meters."

(2).

(b) Drawings;

forest 6 Afforestation 31

A person shall be appointed.

2. Invention 2

A. Summary of the invention

The Japanese Patent Gazette No. 5 - The semiconductors described in the Japanese Patent Gazette No. 29406 (Publication of February 5, 1993)

In the case of an invention with respect to a testing device, the substance of the invention is “the previous technology is the surface and inspection of semiconductor wafer (11).”

In the event that the reputation of the surface of the fraud board (2) is not secured, the tearsen (7) and the tearsen (12) and the electric power;

However, there was a problem that the reliability of the prosecutor was deteriorated because the prosecutor did not sufficiently obtain sufficient contact;

This invention, in semiconductor inspection devices, is subject to either (1) or (14) or (14) or subject to such device.

(2) The number of Preamble cards (1) with Preamble cards (1) and inspection board (2) with Preamble lines (13) connected to each other and (1) with Preamble cards, each of which is accompanied by

(1) by adopting the composition connecting B. B. and B. B. P. P. P. P. P.T. T. (13) with P.P. T.T.

The card (1) is subject to the coordination of the slope of the inspection board (2) on the card, and accordingly, on the semiconductor wafer.

The reliability of the inspection shall be secured by a good electrical contact with the trode of the electric circuit and the inspection board to ensure the reliability of the inspection.

It can be known that the improvement is "......."

(b) Drawings;

Do1 Do1 3

1: 53, 5byty

2: 13 I

A: cents 14 :

Do6

3. Invention 3

A. Summary of the invention

Japan Patent No. 6 No. 3- 65659 (Disclosure of March 20, 1991) 'proba

D as an invention related to “D”, its summary “in case of a prob card, card board (2), auxiliary board (5), buffer board (5),”

(6) In the absence of (6), (3), and (7) for flat coordination, the auxiliary board is equipped with a transparent board attached with a panf, and (7) for flat coordination;

(5) The line board (7) set up on the card board (2) by turning back to the right or the right or right or right or right or the right or right or right or right or the right or right or right or right or right or right or right or right or right or right or right

A. (5) Contact with A. B. H. H. H. H. H. H. H. H. H.D., and due to its lectures, the foregoing paragraph (3) is not a buffer

It is known that it is "a coordination in the parallel shape throughout the world."

(b) Drawings;

Do3

A person shall be appointed.

4. Invention 4

A. Summary of the invention

No. 8 of Japan Patent No. 6-5090 (Disclosure February 25, 1994)

In the case of the card "B", the summary of the card is "not equivalent to the failure of the semiconductor integrated circuit."

Pursuant to paragraph (1) of this Article, a machine for the expansion of fix plates, such as red-story plates (101) shall be avoided on one side.

Preparation of metal plates (104) consisting of arrangements identical to the arrangement of the measurement chip (102) par (103) ;

Any person who directly or indirectly connects the metal set (104) to the prob, with a vertical link, and the prob.

Madin 105) Finbrobed with each other (106 to 108) metal circuits (104) by virtue of 106 to 108

Linked or consisting of finine (205) directly connected to metal shorts (204) by means of a dam water supply, etc.

agency may be known to the public.

(b) Drawings;

Do 1 Do 2

A person shall be appointed.

Attached 3. Other Evidence

1. Evidence No. 7;

A. Summary of the invention

Japan Patent No. 1 - 150862 (Disclosure, 1989, 13 June 13), “prob card” described in “prob card”

As an invention, the summary of the " multiple contact points prepared on a prob card board" shall be each of the semiconductor devices.

In connection with the protocol card that contacts the electric circuit and inspects the electric signal by entering and printing it, a probb,

1) The card board (11) set up multiple electric lines (12) on the face, and the group of such electric lines (12).

B clb card board (11) form a flblblin type contacter (13) with flblblin type

each contactr (13) even if there is a difference in height of electric power failure (6) formed in semiconductor devices (5).

It can be known that “technology” is “a technology that makes it possible to have good contact by having shot contact with the former (6).

(b) Drawings;

Do2

A person shall be appointed.

4:

S:IN

4 : 電播心9F

2. Evidence No. 9:

A. Summary of the invention

Inspection of integrated circuits devices listed in the Patent Gazette No. 5, 355, 079 (Public Notice of October 11, 1994) of the United States of America

The invention of "prob assembly" for the purpose of this, the summary of which is "the search card assembly shall be PCB (10)," and

Members (13), members (14), members of contact with string (F), members of contact with string (14), galivities (15), and 4

Jinna (S1 to S4) as a major component, and all sping contacts to inspect the ICT device.

Contacping is to have contact with all contact seals of the ICT device by force of the same size substantially.

It is essential to ensure that the area of contact is subject to the removal of the ICT device as soon as possible, and the ICT device.

and where there is a difference in official space because the face area of contact between the search card assembly and the search card assembly is not accurately balanced;

S1-S4) To achieve the desired balance, four controlnas (S1-S4) incorporated into the original HD

It is possible to make necessary amendments by making it possible to do so.

(b) Drawings;

Do2

A person shall be appointed.