2. Litigation costs shall be borne by the plaintiff.

A. Patent invention of this case

(a) Name: semiconductor testing device;

(2) Date of application/priority claim/registration date/registration date/registration number: April 4, 1997/ April 5, 1996/ September 24, 2002/ No. 355422

(3) Patent holder: the plaintiff;

(4) Claims (main drawings are as shown in Appendix 1.).

1.On the tamping of semiconductors, the tamping of semiconductors and the tamping of semiconductors to be equipped with the tampling of semiconductors and the tampling of semiconductors; the tamping of semiconductors and the tampling of semiconductors with the tampling of semiconductors and the tampling of semiconductors to be carried out by the tampling of semiconductors and non-spampling of semiconductors, each of which is in the state of suspension after being equipped with the tampling of semiconductors and the tampling of semiconductors to be carried out by the tampling of semiconductors and non-spampling of semiconductors through the tamping of semiconductors and non-spamping of semiconductors. After the completion of the examination, the tampling of semiconductors and non-spamping of semiconductors to be carried out by the tampling of semiconductors and non-spamping of semiconductors, each of which is marked by the tamping of those parts.

2. An aviation test panel consisting of two or more semiconductors and two or more Hands equipped with the aforesaid part of the semiconductors, each of which is equipped with a multiple divers of semiconductors toweres, and the semiconductor test divers of the semiconductors and two or more divers of the semiconductors, and the semiconductor divers of the semiconductors and two or more divers of the semiconductors so that these divers of the semiconductors and two or more divers of the semiconductors can be carried out of the semiconductors so that the divers of the semiconductors and two or more divers of the semiconductors can be carried out of the semiconductors so that the divers and two or more divers of the semiconductors can be carried out of the semiconductors so that the divers and two or more divers of the semiconductors can be removed from the divers of the semiconductors that have been tested by the divers of the non-sivers, and after the completion of the examination, the tethr.

3.On the tamping test line of semiconductor posters; Hands and Hands of semiconductors equipped with the aforesaid tamping parts; this tampling line shall be equipped with multiple tamplings of semiconductors on the tamping of semiconductors, and the semiconductor tampling of semiconductors on the tamping of semiconductors and the tampling of semiconductors on the tampling direction of semiconductors to be carried out of the tampling of semiconductors through the tampling of semiconductors and the tampling of semiconductors to be carried out of the tampling of semiconductors to the tamping of semiconductors, to be carried out of the tampling direction-setting of semiconductors, and to be carried out of the tampling of semiconductors to the tamping of semiconductors, to be carried out of the tampling of semiconductors and the tampling of semiconductors, after the completion of their tests, to be carried out from the tamping of semiconductors and to be taken out of the twits.

4. In any of the claims in paragraphs 1 through 3 above, semiconductor DNA, which is received in a semiconductor DNA receipt container referred to as "salvout of the sealed shape", shall be re-exporteded to the test team and tested, even if semiconductor DNA, which is received by the pan-tetra, and returned to the test team, and the semiconductor DNA, which is composed of several processings for semiconductor DNA, the test results of which are completed based on the data as a result of the test, shall be carried out in each salv and dys combined with each other, and the above log part shall be the place where semiconductor DNA, which is the place where semiconductor DNA, discharged in each of the above salvies, is re-sed into the test team.

In any of the claims in paragraphs 1 to 3 above, the above Hand shall, by transferring semiconductor DNAs received from the string to the string and returning them to the strings, conduct tests by transferring them to the strings and returning them to the strings, and in the strings part, the semiconductor DNA testing device, which consists of several processings for semiconductor DNAs which have completed tests based on the data of the test results, is called the horizontal return method.

6. For claims 6.For semiconductors, the above semiconductor testing device shall be more equipped with the second dives license and the second dives license of semiconductor devices, and the second dives license of semiconductor devices shall be installed at the above test part in the course of return of the divers of the above divers, and the above divers shall be installed in the course of return of the divers of the tevers, the tevers of the tevers of the return of the tevers of the tevers, and the multiple dives of the tevers of the tevers of the semiconductors of which the two or more divers of the semiconductors of which the tevers return direction and horizontal divers of the tevers of which the tevers’ second dives of the semiconductors of which are similar to the other divers of the teves of the tevers of the teves of which are similar to the other teves of the aforesaid tevers.

7. For the purpose of paragraph 1, semiconductor testing devices shall be equipped with the third dives license and tamping license of semiconductor devices, the third dives license of semiconductor devices shall be installed on the dives of such semiconductor devices in the return route of the sives from such dives to the said dives, and the said teves shall be installed in the course of return of the sives of the teves, the two or more dives of the teves return direction of the teves, the multiple dives of the teves return direction of the teves and the multiple dives of the sives return direction of the teves and the semiconductor dives of the semiconductor to the sives return direction of the teves, and the tves of the other sives of the teves signature to the sives of the teves signature to the sives of the teves return direction.

8.For the purposes of paragraph 1, semiconductor testing devices shall be provided with the second shots of semiconductor devices and the third shots of semiconductor devices, the second shots of semiconductor devices shall be installed in the course of returning semiconductor devices from the above shots to the above shots, and the third shots of semiconductor devices shall be installed in the course of returning semiconductors to the shots of semiconductor devices, the second shots of which are capable of the second shots of semiconductor devices and of the second shots of semiconductor devices, the second shots of which are capable of the second shots of semiconductor devices and of the second shots of semiconductor devices, the second shots of which are capable of the second shots of the two shots of semiconductor devices, the second shots of which are capable of the second shots of the two shots of the first shots of the two shots of the first shots of the two shots of the first s.

In any of paragraphs 1 to 3 and 6 to 8 of this Article, each semiconductor DNA detection center shall be equipped, each of the above semiconductor DNA shall be arranged in the direction of movement and rectangular angle of the test, each of which shall be arranged in the direction of the test in the direction of the test, each semiconductor DNA is installed in response to each semiconductor DNA type on the test, each of which shall be made into two parts of the luminous source and the luminous source of the luminous source, and each of which shall be made into two parts of the luminous source and the luminous source of the luminous source, with the characteristics of the luminous source that detects the luminous source of the dial source.

In paragraphs 10.1 to 3 and 6 to 8 of this paragraph, each semiconductor DNA detection center shall be equipped with multiple semiconductors, each of which shall be arranged in the direction of movement and rectangular angle of the spart, and each of them shall be arranged in the direction of movement of the spart, each semiconductor DNA type on the tepart, respectively, shall correspond to each semiconductor DNA type display on the tepart, and each of them shall be in the motive and motive of detecting the spamping of the above two or more semiconductors corresponding to the sptoning mark, with a feature of detecting the detection of the semiconductors, other than the detection of the semiconductors on the sptona in which the aforesaid multiple semiconductors are in response to the sptoning mark.

1. to 14. (Omission) Claims

In any of the claims 15.1 to 3 and paragraphs 6 to 8, the above mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincings of the above mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincings installed on the framework of the said table, and such mincing mincing min

In any of the claims 16.1 to 3 and paragraphs 6 through 8, the above mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincing mincings, which is characterized by a detection signal printed from the aforesaid semiconductor mulcing mincing mincing mincing mincs, which is installed in the framework of the said stitr.

17. (Omission of Claims)

In Claim 18.9, each semiconductor DNA detection center consists of luminous source and luminous source, and is placed on one side of the flats where the said luminous source moves the tetlate, and is placed on the opposite side of the plane where the said luminous source moves the said tetlate, and forms a pipe hole at the center near the center of each semiconductor DNA Capital installed on the tetlate, and the light from the luminous source is found to be above, and is characterized by such luminous source to determine whether or not the light passes this pipeline and whether or not it passes through the semiconductor DNA.

20. (Omission of Claims)

21.Once it is equipped with the tamper and the tamper of each semiconductor, it shall be turned out from the tamper to the tamper of which the semiconductor is in a stop condition, and shall be turned out from the tamper to the tamper of which the test is conducted, and after the completion of the test, the tamper of which is loaded with the semiconductor (hereinafter referred to as the "stamper of semiconductor detection" in the tamper of which the semiconductor is non-existent at the stage of semiconductor detection by the tamper of which the aforesaid tamper is non-existent, and shall be removed from the tamper of which the semiconductor is non-existent at the stage of semiconductor detection by the tamper of which the tamper is non-existent, and shall be removed from the tamper of which the tamper is non-existent at the stage of semiconductor detection by the tamper of which the tamper is non-existent.

Pursuant to Claim 22.1, a circuit shall be further equipped, and the first copis of semiconductor devices shall cause detection signal when detecting the existence of semiconductor devices left by monitoring whether or not semiconductor devices are left in the tecar Loan on the tecar on the tecar Loan, which is returned from the above divers to the said divers, and the said semiconductor devices shall have characteristics of issuing warnings in response to the detection signal from the first copis of semiconductor devices.

Pursuant to Claim 23.2, a circuit shall be further equipped, and the second copier of the semiconductor DNA shall have a detective signal when detecting the existence of an empty semiconductor DNA on the testar return from the table above to the estrode, which shall be returned from the table above, by monitoring the existence of such semiconductor DNA, and the said semiconductor circuit shall have a feature of warning in response to the detection signal from the second copier of the semiconductor DNA.

In regard to claims 24.3, a circuit shall be further equipped, and the third autopsy of the semiconductor DNA shall have a signal to detect the existence of any such device by monitoring whether or not there is any semiconductor DNA capital on the testar on the testar which is returned to the above test book in the latter part, and the said circuit shall have a characteristic of giving warning in response to the detection signal from the third autopsy box of the semiconductor DNA.

Pursuant to Claim 25.6, the first costation of semiconductor DNA is equipped with a circuit more, and the first costation of such semiconductor DNA has occurred when detecting the existence of the detection by monitoring the existence of the semiconductor DNA left in the test panel on the tecar project on the tecar, which is returned from the above ecurine to the said ecurine, when detecting the existence of the semiconductor DNA, and the second costation of semiconductor DNA has the characteristics of detecting the detection signal in response to the detection signal from the first and second costations of semiconductor DNA to the above ecurine returned to the above ecurine.

Pursuant to Claim 26.7, a circuit shall be further equipped, and the first costation of semiconductor devices shall have a signal of detection when detecting the existence of a semiconductor DNA in order to detect the existence by monitoring the existence of the semiconductor DNA left in the tecar Loan on the tecarar on the tecarar return from the above ecurine to the above ecurine, and the third costation of semiconductor DNA shall have a signal of detection when detecting the existence of such semiconductor DNA source on the tecar return from the above ecurine to the above ecurine, and the above ecurine shall have a characteristic of monitoring the existence of the semiconductor DNA source on the tecar return to the above ecurine to the above ecurine, with a signal given in response to the detection signal from the 1 and 3rd cos of semiconductor DNA.

Pursuant to Claim 27.8, the first costation of semiconductor DNA shall be made with more time to detect the existence of a detection signal by monitoring whether or not semiconductor DNA has been left in the tecar on the tecar project on the tecar line returned from the above ecar line to the above ecarator, and the second costation box of semiconductor DNA shall be made when detecting the existence of such semiconductor DNA on the tecar line returned from the above ecar line to the above ecar line, and the second costation box of semiconductor DNA shall be made when detecting the existence of such semiconductor DNA, when detecting the existence of such semiconductor DNA, and the third costation box of the semiconductor DNA shall be made when detecting the semiconductor signal from the ecar line to the above ecarn part to the above ecarn part to detect whether or not semiconductor DNA DNA exists.

28. (Omission of Claims)

(b) Cited inventions;

(1) Cited Invention 1 [The Patent Gazette published on February 4, 1994 (Specialized 6-27192), No. 1, and Major Drawings are as shown in Attached Form 2].

The term “Automatic Hand delivery room” is composed of the robbbbs, e-mail (26), thrhnbs (28), trobs (30), strings (36a, 36b), strings (36b), strings (32a, 32b), and two thrings (32b). The IC and other electronic parts in the robs (26) are moved from the strings (24) to the string (24) and the strings (24) are moved from the strings (34) to the strings (36a, 36b) and the strings (2) are returned to the outside strings (36b) and the strings (4) of the strings (24) are returned to the strings (3) and the strings (4) of the strings are returned to the outside 24thr.

(2) Cited Invention 2 [The Patent Gazette (Patent Gazette No. 4-312952, Nov. 4, 1992), No. 2, and the main drawings are as shown in Attached Form 3] disclosed on November 4, 1992

4) The method of manufacturing semiconductors is indicated in the 2nd place (or 4) and 2nd heading (or 22nding) of the 4th heading (or 4thing method) of the IC (or 2nding method) of the IC (or 22nding method) of the IC (or 22nding method) of the IC (or 4thing method) of the IC (or 22nding method) of the IC (or 22nding method) of the IC (or 22nding method) of the IC (or 22nding method) of the IC (or 4nding method of the IC) of the IC (or 4nding method of the IC) of the IC (or 22nding method of the IC) of the IC (or 22nding method of the IC) of the 1sting method and the 2nding method of the IC (or 21sting method) of the 2nding method of the 22nd (222nd

C. The procedural background

(1) The Defendant filed for a registration invalidation trial on the ground that the patented invention of this case can be easily described from the cited Invention 1 and 2, and thus, the Intellectual Property Trial and Appeal Board (the Intellectual Property Trial and Appeal Board) reviewed the patented invention as 2005Da595 on February 28, 2006, and rendered a decision of this case to accept a request for a trial on the inventions of paragraphs 1 through 10, 15, 16, 18, 21 through 27 and dismissed the request for a trial on the remaining claims on the grounds as follows.

(2) Summary of the trial decision on the invention of paragraphs (1) through (10), (15), (16), (18), (21) through (27) of this case

(A) The premise part of the instant Claim No. 1 is identical to the circular test part, composition, and function of the cited invention 1, and the remaining elements of the instant Claim No. 1 are substantially identical to that of the comparable invention 2. Since the previous part of the instant Claim No. 2 related to the previous technology of the comparable invention No. 1 indicated that the comparable invention No. 2 can be combined with the test part, it may be easily combined with the circular test part publicly known in the comparable invention No. 1, and the relevant business operator may directly recognize the installation location of the instant Claim No. 1 by combining the semiconductor test part with the semiconductor test part, which is widely known in the comparable invention No. 1, and the action effect therefrom may also be easily predicted. Thus, the nonobviousness of the instant Claim No. 1 invention can be easily inferred from the cited invention No. 1 and 2.

(B) The instant Claim 2 invention is identical to the instant Claim 1 invention with the exception of the fact that a semiconductor DNA detection center is installed between the test room and the speech room, and the instant Claim 3 invention is identical to the instant Claim 1 invention, except the fact that a semiconductor DNA detection center is installed between a semiconductor DNA and the test room. The location where a semiconductor DNA detection center is installed can be modified by selecting it from among the channels of the circulator, so the instant Claim 2 and Claim 3 invention is not recognized as being identical to the instant Claim 1 invention.

(C) The elements of the instant Claim 21 are identical to the action, composition, and function of the circular test Hander of comparable inventions 1. The remaining elements of the instant Claim 21 are identical to those of comparable inventions 2’s corresponding stages. The remaining elements of the instant Claim 21 are the same as those of comparable inventions 2’s corresponding stages, and the effect of detecting whether semiconductor devices exist in the test radar is identical. Thus, the instant Claim 21 invention can be easily described from comparable inventions 1 and 2, and non-obviousness is not recognized.

(D) The inventions of paragraphs (4) through (10), (15), (16), (18), (22) through (27) of this case are subordinate claims embodying the inventions of paragraphs (1) through (3) of this case, and the inventions of paragraphs (6) through (8) of this case, and are subordinate claims embodying the inventions of this case by limiting or adding, and there is no technical difficulty in the composition of limited or added matters, and their action effects can be sufficiently predicted. Thus, non-obviousness is not acknowledged.

【Evidence A’s Evidence Nos. 1 through 3, B’s Evidence Nos. 1, 2, and the purport of the whole pleadings

2. Summary of the grounds for revoking the trial decision asserted by the Plaintiff

A. On the basis of Paragraph 1 invention of this case where the location of semiconductor DNA detection center among the patented inventions of this case was "the distance between the ropier and the ropier" among the patented inventions of this case, the defendant only requested the plaintiff to prohibit the infringement, and the location of the semiconductor DNA detection center was "the distance between the ropier and the ropier" or "the distance between the ropir and the ropir", which constitutes the invention of paragraphs 2, 3 and 23, 24 of this case and the independent claim concerning the method of detecting semiconductor DNA detection of this case, which covers both the invention of this case and each of the above implementation forms, and it was not proved that the plaintiff did not have any right against the plaintiff and that there was a concern that it might be a counter-party to the right of the future, and thus, a request for a trial on the invention of this case shall be dismissed by an unlawful person without an interest.

B. The Claim 1 invention of this case is for circular test Hands, and the comparable invention 2 does not have any implication on the application of circular test Hands, and the comparable invention 2 is rather premised on the use of the non-circulating test device. Thus, no motive exists in the Claim 1 invention of this case from the comparable invention 2. Further, the Claim 1 invention of this case can not be found from the comparison invention 2, based on the new perception of the problems that semiconductor test can be caused the malfunction of semiconductor test because the semiconductor test is left in circular test in the circular test method, and the semiconductor test 1 invention of this case can not be found to be non-obviousnessd in the semiconductor 2 invention of this case by first presenting the composition of semiconductor detection license on semiconductor 1 to semiconductor 2, the composition of the new semiconductor test 1 to 6, and it is difficult to attain the reliability of Claim 1 to find out the effects of the Claim 2 of this case prior to the comparison invention of this case.

3. Determination

A. Whether the defendant is an interested party who can file a petition for an invalidation trial on the invention under paragraphs 2, 3, 21, 23, and 24 of this case

(1) An interested party entitled to request a trial for invalidation of a patent refers to a person who conducts the business of manufacturing and selling articles by executing the invention of a patent, or a person who is presumed to use the invention of a patent in light of the nature of his business, and such interested person includes a person who is likely to suffer occupational damage or to suffer subsequent damage (see Supreme Court Decision 85Hu46, Jul. 7, 1987).

(2) According to the evidence admitted by Paragraph (1), the defendant is a company that develops, manufactures, sells, and provides various semiconductor-related devices, including circular testing hand, and the defendant infringes on the invention of Paragraph (1) of this case, which is the location of the semiconductor testing device installed and sold by the defendant using semiconductor testing devices as "the location of the semiconductor testing device is between the speecher and the backer," and thus, prior to the date of the petition for a trial of this case, the plaintiff, the patentee of the patented invention of this case, filed a lawsuit claiming prohibition of patent infringement, etc.

(3) Therefore, the defendant is a legitimate interested person entitled to file a petition for an invalidation trial on the invention of paragraphs (2), (3), (21), (23, and (24) of this case.

B. Whether the invention described in paragraphs (1) through (10), (15), (16), (18), (21) through (27) of the instant case is inventive step

(1) Claim 1 invention of this case

(A) Preparation for composition

(1) Composition of a premise unit

The premise part of the instant Claim No. 1 invention consists of comparable inventions 1, rosar (26), rosar (30), trosar (36a, 36b), multiple test stampar (24), etc., and electronic parts, such as ICT, which are in the rosar (42) from the rosar (26) move from the rosar (26) to the trosar (24), and the trosar (24), which are returned to the trosar (36a, 36b), are returned to the trosar (36a, 36b), are returned to the trosar (24), and the trosar (24) is returned to the trosar (30), and the trosar (42) is divided into the trosar (42), and the trosar (26th) operation of the trosar in the same circulation method.

(2) Components 1

The elements of Claim 1 invention of this case are corresponding to the composition of a luminous (40a) and a light emitting machine (41b, 42b) which detects the existence of semiconductor devices in the manufacturing method and the manufacturing method of semiconductor devices, such as comparable invention 2, ICT, etc., and the light emitting machine (41b, 42b) which detects the location of semiconductor devices, and other mincing devices (41b, 42b), and light emitting machine (40b) which detects the location of the mincing device, and a light mincing machine (40b), which are installed in the return route of the chemical (21) in receipt of ICT on multiple mincs (22). Both compositions are the same in that the existence of semiconductor devices, such as ICT, etc., are detected by means of a license detecting the semiconductor devices and the semiconductor devices installed in the semiconductor method in which the semiconductor devices in this case are detected. However, the elements of Claim 1 of this case are not specifically different from each other than those installed in the semiconductor 2.

However, the comparable invention 2 is a method of manufacturing semiconductor devices that can be collected in the process of semiconductor devices, such as ICT, in the process of semiconductor devices, in a uniform external dimension, and can be processed by putting in each processing device, without receiving semiconductor devices in the process of semiconductor devices and using them in the process of receiving semiconductor devices. As such, the part concerning the previous technology is an example of the process treated by ICT as half-finished products in the process of the ICT, and the test process is indicated to be carried out by the test handler and the test board. As such, the above implications from the above implications to detect semiconductor devices of the comparable invention 2 such as the semiconductor devices (40a, 41a, 42a) and the optical boms (40b, 41b, 42b) and the optical boms (a) of the comparable invention 1, which can not be readily concluded to be applied to the Plaintiff’s semiconductors or the combined bombs of the comparable invention 2.

Furthermore, as seen in the comparison with the part on the premise of the circular test Hand of the comparable invention 1, it is composed of a log (26), rost (30), testrh (36a, 36b), and testrh (36b), etc., so it can be easily known that a semiconductor 2 of the comparable invention 2 is capable of detecting a semiconductor dr(40a, 41a, 42a) and a luminous rayer(40b, 41b, 42b) known to the comparable invention 1, and a luminous rayer(40b, 41b, 42b) with a circular testrbrative test blicker(30) and a rost(26), a semiconductor (26) and a testr(36b,36b) and a semiconductor (36b, 36b, and 36).

In particular, the route from the 30thr to the rost (26) in the circular test Hand of the comparable invention 1 is located on the open side of the upper part (the patented invention in this case is also the same) that can be observed by the rost (the patented invention in this case; hereinafter the same shall apply). If the semiconductor DNA who has completed the test is not released from the rost (30) but is returned to the rost (26) normally, it is easy to find out the phenomenon that the semiconductor DNA who has finished the test is not released from the rost (30) and is returned to the rost (26). This phenomenon makes it difficult to find out the problems that may cause the error classification of semiconductor DNA because semiconductor DNA is loaded twice in the trostal, and if the semiconductor DNA is damaged or interfered with the return of the device by falling off the return of the semiconductor.

Therefore, if a business operator aware of the above problems in circular test Hands like comparable invention 1, he/she may prevent the same problem as the error classification of semiconductor devices by detecting the elements of the luminous devices (40a, 41a, 42a) and the luminous sprinker (40b, 41b, and 42b) of comparable invention 2 in the “splates (30)” among the circular test test Hands of comparable invention 1 in the “sprinks (30) and the route (26).” Thus, the elements of the instant Claim 1 invention can be easily derived from the combinations of comparable invention 1 and 2.

(3) Components 2

The elements of Claim 1 invention 2 of this case include slots and sets for the tride of comparable invention 1, the electronic parts to be tested, and multiple glars (22) accurately heating the electronic parts are identical to those of the strings (24) in the strings (24), and there is no difference in the composition of multiple grings (22) receiving the semiconductor devices of comparable invention 2 of the invention 2 of the same invention, which are parallelly displayed parallelly on the strings and the strings (21). The elements of Claim 1 of this case can be attached to the strings (2 of the invention of this case) and the 2ndrings (22) of comparable invention 2 of the same invention can be combined with the strings (16th) of the strings (21) of the same invention, but the strings (22nds) of comparable invention 2 of the same invention can be combined with the strings (21).

(4) Components 3

The elements of Claim 1 invention 3 of this case correspond to the compositions of each package (22) of an annual installments (23) in response to the center line of each package (22) of the package (22) of the parallel invention 2 in response to the return direction of the arms (21). The difference between a string mark (503) or a hole for position determination (23) is a means that can be easily selected through simple design modification. The two components form a tring mark (503) or a hole for position determination (23) on the tring or the arms returning semiconductor DNA (503) or a hole for position determination (23) to identify the location of the tring or the arms (21) in response to the return direction of the arms (21) of the cited inventions 2 of this case. The function and effect of the tringing are the same in that it is possible to detect the existence of a semiconductor DNA license in other programming.

(5) Components 4

The elements of Claim 1 invention 4 of this case are as follows: when the hole (23) for determining the location of the arms at the comparable invention 2 is located under the luminous (40a) immediately below the luminous (40a), it is possible to detect the location of the luminous hole (23) through the luminous measuring hole (40b) and to detect the location of the luminous hole (23) through the luminous measuring hole (40b), and the luminous (41a, 42a) and the luminous measuring hole (24b, 41b, 42b) and the luminous measuring hole (41b, 42b). As such, the location of the radioactive at the Parag. 12 of the instant Claim 1 of this case was found to have been found to have been found to have been found to have been able to have been found to have been found to have been able to have been found to have been able to have been able to have been found to have been able to have been able to have been found to have been 4121 or 4 (4).).

(b) Preparation for purposes and effects of action;

As seen in the comparison with the foregoing components 1, the purpose and effect of the Claim 1 invention of this case, which, as described in the comparison with the foregoing components 1, is easily derived from the combinations of comparable inventions 1 and 2, the purpose and effect of the Claim 1 invention of this case, the semiconductor DNA is to prevent the problems, such as the error classification of semiconductor DNA, by installing the tamper (30) in the tamper (30) and the tamper (26) of the tamper (40b, 41b, 42b) and the tamper (40b, 41b, and 42b) of comparable inventions 2, among the tamper return routes of the tamper of the tamperbrobr of comparable inventions 1.

(C) Arrangement of preparation results

The instant Claim 1 invention can be easily described by means of “a method installed between the worder (30) and the loger (26)” among the tegrative test return channel of the tegrative test Hander, such as the comparable invention 1. The purpose and effect of the instant Claim 1 invention can also be easily derived from the combination of the foregoing comparable inventions. Thus, the nonobviousness of Claim 1 invention of the instant case is not recognized by the comparison invention 1 and 2.

(2) Claim 2 and Claim 3 of this case

In the instant Claim 2, it is installed in the temination of semiconductor 2, “the distance between the temination of semiconductors and the temination of semiconductors.” Since the temination of semiconductors and the temination of semiconductors are found to exist on the temination of semiconductors which are installed in the temination of “the temination of semiconductors and the temination of the temination of semiconductors,” the temination of semiconductors and the temination of the temination of semiconductors installed in the temination of semiconductors and the temination of the temination of semiconductors which are easily found to exist on the temination of semiconductors and the temination of semiconductors, and thus, the remainder of the instant Claim 2 and paragraph 3 inventions are the same as the instant Claim 1 invention, and if the temination of the temination of the temination and the temination of the temination of semiconductors and the 4th te.

(3) Claim 4 invention of this case

The instant Claim 4 invention is a subordinate claim of the instant Claim 1 to Claim 3, which is limited to those that can be used both as a string and a string. However, in the technical task of the specification (Evidence A) of the instant patent invention, the technical task of the detailed description of the instant invention is “if the string is short, the string is limited to the string of the string of the string chain, which is received on the thring container. In the case of the IC, the IC, which is received on the string, shall be stored in the string and returned to the string, which shall be carried out various kinds of treatment based on the data on the test result, and the inventive step of the bring-type hand (see, e.g., Japan Special Rule 6-17191) is equally stated in the specification (see, e., Supreme Court Decision 2007Da1411, Apr. 2, 2007).

(4) Claim 5 invention of this case

The instant Claim No. 5 invention is a subordinate claim of the instant Claim Nos. 1 through 3, and is limited to a Hand, referred to as a means of horizontal return, but the said limited composition is identical to the composition of the part, which is made by circular test test hand, from Cited Invention 1, by means of horizontal return, and thus, the nonobviousness of Claim No. 5 invention of the instant case is not recognized by Cited Invention 1 and 2.

(5) Inventions 6 to 8 of this case

The inventions of paragraphs 6 through 8 of this case are subordinate to the inventions of paragraph 1 of this case, which are more equipped with the second sponsor and the sponsoring sponsor’s second sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s sponsor’s spons.

(6) Claim 9 invention of this case

The instant Claim No. 9 invention is subordinate to the instant Claim Nos. 1 through (3) and paragraphs 6 through 8. In the instant Claim No. 9 invention, the composition of only the semiconductor DNA detection license in the instant Claim No. 9, which is the composition of only the semiconductor DNA detection license in the instant Claim No. 9, is not different from the return direction of multiple luminous measuring devices (41a, 42a) and luminous spampers (41b, 42b) capable of detecting the existence of information in the diskettes No. 22 in the instant Claim No. 9, on the grounds that there is no difference in the composition of the instant Claim No. 9 invention that was installed in response to the spons (21) in the form of return direction and spick (22).

(7) Claim 10 invention of this case

The invention of this case is subordinate to the invention of paragraphs (1) through (3) and (6) through (8) of this case. The composition that was embodied only in the invention of paragraphs (10) of this case is composed of multiple luminous devices (41a, 42a) and luminous rayers (41b, 42b) in comparable Invention 2, which detect the existence or absence of an information in the diskettes (22). The non-obviousness of the invention of this case is not recognized by paragraph (10) of this case since there is no difference in the composition of semiconductors in the breadth (22) corresponding to the tamping tamping tamping tamping 40a (40a) and the tamping tamping tamping 40b) which are found in the tamping tamping 23 (22) corresponding to the tamping hole (23).

(8) Claim 15 and Claim 16 of this case

The instant Claim Nos. 15, 16 inventions are subordinate to the instant Claim Nos. 15, 15, and 16 through 8, and are limited to the slot hole or fin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-cin-ciping light, however, in light of the use and function of other programming marks, as a matter of course, the foregoing composition is naturally derived, and there is no difference in the composition of detecting light (40b) in which the luminous 2 of the instant Claim Nos. 15, 16 inventions are detected through a hole for location determination (23). Thus, the nonobviousness of the instant Claim

(9) Claim 18 invention of this case

The instant Claim No. 18 invention is subordinate to the instant Claim No. 9, and the composition limited to the instant Claim No. 18 invention is identical to the composition of a multiple luminous measuring devices (41a, 42a) and luminous measuring devices (41b, 42b) respectively, which detect the existence or absence of information in the instant Claim No. 18 (24) invention from comparable Invention No. 2, and are placed on both sides of the arms (21) and the luminous measuring devices (41a, 42a) which form an luminous hole (24) at the center of the floor of the arms (21) and determine whether or not the light of the luminous measuring devices (41a, 42a) is detected in the luminous (24) through the Aeronautical joints (24) for the purpose of the radioactive Inspection, and thus, the instant Claim No. 18 (18) and 22 of the Invention invention is not recognized by the non-obviousness of semiconductor invention.

(10) Claim 21 invention of this case

(A) the components 21-1

The elements of Claim 21 of the instant invention are premised parts, 21-1, in the circular test Hander of the comparable invention 1, electronic parts, such as ICT, etc., located in the ro (26) in the rost (26) to the test (24) and transferred from the rost (26) to the test (24), the test (24) which was returned to the test (36a, 36b) and was returned to the test (36a, 36b), and the test (24) was returned to the test (30), and the test (24) was returned to the test (30). The test (24) was the same as the test (26) method in which the test (24) was returned to the test (26) method in which the test (26) method was repeated.

(b) the components 21-2

The elements of Claim 21 invention of this case are the same as the stage of detecting 21b, 42b from luminous ray (41b, 42b) by surveying light from a light source (41a, 42a) located on one side of the twit (21) to the point where the arms (21) loaded by semiconductor DNA is returned in the cited Invention 2 of this case.

(C) the components 21-3

21-3 The elements of the instant Claim 21 do not differ from the stages of detection by optical (40a) and optical (40b) optical (40b) of a hole (23) formed by the center line of each of the diskettes (22) on the plane table (21) in comparable inventions 2, and there is no difference from the stages of detection by optical (40a) and optical (40b). As seen earlier, other mintmark (503) or a hole for position determination (23) can be easily selected through simple design change.

(D) the components 21-4

The elements of Claim 21 invention of this case are the same as the stage of detecting the location of a hole (23) for the purpose of determining the location of the asphalt (40a) at the time of the location below the luminous (40a) depending on the return of the asphalt (21) from the comparable invention 2, through the luminous (40b) of the luminous (40a) of the luminous (40b) of the luminous (40b) of the luminous (43), and detecting the location of the luminous (23) of the luminous (41a, 42a), and detecting the luminous (41b, 42b) in the same manner in line with the luminousing of the detection thereof.

(e) Arrangement of the results of preparation

The instant Claim 21 invention is an invention concerning the method of detecting the existence and non-existence of semiconductor devices using the semiconductor devices of semiconductor devices, such as the instant Claim 1 invention. The elements of the instant Claim 21 are identical to the composition of circular testing devices of comparable invention 1. The remaining elements of the instant Claim 21 invention are not different from those of comparable invention 2. The instant Claim 21 invention can be easily combined with the cited invention 1 and 2 as seen in subparagraph 2(a). As seen in the instant Claim 21 invention, the purpose and effect of the instant Claim 21 invention can be easily derived from the combination of the foregoing comparable inventions. Thus, the nonobviousness of the instant Claim 21 invention is not recognized by the Cited Invention 1 and 2.

(11) Inventions 22 to 27 of this case

The inventions of paragraphs 22 through 27 of this case are subordinate to the inventions of paragraphs 1 through 3, and paragraphs 6 through 8 of this case. When detecting the existence of semiconductor DNA in the semiconductor DNA detection center or an empty semiconductor DNA is found to exist, it is not clearly indicated that the warning is issued in response to the detection signal. However, even though there is no express indication that the warning is issued depending on the identification in the comparable invention 2, it is not possible to easily recognize the non-obviousness of the aforementioned paragraphs 2 through 27 of this case because, if the business operator is involved, it is not widely known that the IIC would issue a warning in response to the detection signal if he finds abnormal or non-existent or non-obviousness of the invention of this case, it cannot be seen that there is an additional element of paragraph 1 to 27 of this case.

C. Sub-committee

The defendant constitutes a legitimate interested person who can file a petition for a trial on invalidation of a patent as to the inventions of paragraphs (2), (3), (21), (23), (24) of this case. The invention of paragraphs (1) through (10), (15), (16), (18), (21) through (27) of this case is not recognized as non-obviousness, and the registration of this case must be invalidated. Thus, the trial decision of this case as stated above is justified.

4. Conclusion

Thus, among the decision of this case, the plaintiff's claim seeking the revocation of the part concerning the invention of paragraphs (1) through (10), (15), (16), (18), (21) through (27) of this case is dismissed. It is so decided as per Disposition.

[Attachment 1, 2, and 3]

Judges Choi Sung-jin (Presiding Judge)